Agilent Technologies' In-Circuit Test Solution Wins Technology Awards

The i3070 Series 5 was named winner for the test category in both the fourth SMT China Vision awards and the 2010 EM Asia Innovation awards announced at Nepcon Shanghai on April 20 and 21, respectively.



In addition, the i3070 Series 5 also was in the finalist category for both the EDN Innovation 2009 awards and Test and Measurement World's 2010 Best in Test awards.



We are honored to receive both the SMT China and EM Asia Innovation awards, and we would like to thank our customers, not just in Asia, but worldwide, for choosing to work with Agilent, said NK Chari, director of marketing for Agilent's Measurement Systems Division. Our mutual rapport, between their board test needs and our drive to anticipate and innovate ahead of the next challenge, is what makes for continued technological advancements in the in-circuit test arena.



The i3070 Series 5 is Agilent's latest in-circuit tester. Innovations include the ability to maintain high compatibility with added features like faster test throughput. A new Agilent Utility Card allows users to maximize their i3070 Series 5 by adding custom functionalities through plug-in electronics. The system also offers wider and more flexible power-management capabilities, and an upgradeable path is available for users still working on the older Agilent 3070 and Medalist i3070 in-circuit testers.