Test & Measurement
Transducers can help measure reservoir levels
With the driest start to a year since 1929, monitoring falling reservoir levels assumes increased importance and can readily be accomplished using RDP transducers. Transducer specialists, RDP Electronics Ltd offer two main approaches for monitoring water levels either using transducers fitted with floats, or alternatively by using pressure transducers.
Oxford Instruments leads the way with innovative SDD technology
The X-Max range of large area silicon drift detectors has been leading the market for over 2 years. Now, Oxford Instruments has launched the next generation, offering unrivalled resolution down to 124eV Mn and 48eV C.
National Instruments Introduces X Series Multifunction DAQ for USB
National Instruments today announced NI X Series multifunction data acquisition (DAQ) devices for USB. USB X Series devices integrate high-performance analog measurement and control channels, digital I/O and counter/timers onto a single plug-and-play device, which engineers and scientists can use for a wide variety of portable test, measurement and data-logging applications. USB X Series DAQ devices include up to 32 analog inputs, four analog out...
Announces Industry’s First PXI RF Vector Network Analyzer
National Instruments today introduced the NI PXIe-5630 6 GHz two-port vector network analyzer (VNA), the automated test industry’s first VNA available in a compact PXI form factor. With support for full vector analysis of transmission and reflection (T/R) parameters, precision automatic calibration and flexible software-defined architecture, the new VNA is ideally suited for automated design validation and production test. Its modular PXI archi...
National Instruments Announces Industry’s First PXI RF Vector Network Analyzer
National Instruments today introduced the NI PXIe-5630 6 GHz two-port vector network analyzer (VNA), the automated test industry’s first VNA available in a compact PXI form factor. With support for full vector analysis of transmission and reflection (T/R) parameters, precision automatic calibration and flexible software-defined architecture, the new VNA is ideally suited for automated design validation and production test. Its modular PXI archi...
Anritsu leads the LTE deployment challenge by assuring faster time to market
Anritsu’s ME7873L RF Conformance Test System and ME7832L Protocol Conformance Test System for testing LTE mobile terminals have already received GCF approval and now have received PTCRB approval for 30 (ME7873L) and 20 (ME7832L) test cases supporting the wireless bands used in North America (Band 4, 13, 17, etc.). With these 50 new approved test cases, Anritsu holds the world lead in most approved test cases (Test program for confirming operati...
National Instruments Introduces New Ethernet Data Acquisition Platform
National Instruments ( announced the new Ethernet-based NI CompactDAQ modular data acquisition system, which combines the ease of use and low cost of a data logger with the performance and flexibility of modular instrumentation. The new NI cDAQ-9188 chassis is designed to hold eight I/O modules for measuring up to 256 channels of electrical, physical, mechanical or acoustic signals in a small (25 by 9 by 9 cm), rugged form factor. With more tha...
Comprehensive Training Course Calendar from Bruel & Kjaer UK
Sound and vibration expert, Bruel and Kjaer UK is running a series of training courses this autumn, designed not only for its customers, but also those seeking a good understanding about noise effects on everyday life. New to the company’s 2010 calendar are multiple sessions of LDS’ Vibration Testing for Engineers course, which are held onsite at headquarters in Royston. Vibration specialist LDS - which became part of the Brüel & Kjær group...
Agilent Technologies Introduces Compact Scanning Electron Microscope for Wide Use in Research
Agilent Technologies Inc. (NYSE: A) today announced the introduction of the Agilent 8500 field emission scanning electron microscope (FE-SEM). The 8500 is a compact system that offers researchers a field emission scanning electron microscope for low-voltage, high-performance imaging in their own laboratory.
Agilent Technologies Announced Handheld Spectrum Analyzer; Makes Infield Measurements Easier, Faster, More Precise
Agilent Technologies Inc. (NYSE: A) today introduced the N9342C handheld spectrum analyzer (HSA), a powerful and straightforward instrument designed for RF technicians and engineers performing installation, maintenance and surveillance of RF systems in the field. The N9342C HSA makes field testing easier by providing faster, more precise measurements, ease of use, and a range of user customization and ergonomic features.