Ultrafast digitisers and AWGs get Digital Pulse Generator option Test & Measurement 15 November 2023 byNews Desk
Data transmission with fibre optic in surgical robotic systems Cables/Connecting 15 November 2023 byNews Desk
Diodes two data lane ReDriver from supports MIPI D-PHY 1.2 protocols Cables/Connecting 15 November 2023 byNews Desk
Smart t-shirt helps manage stress and predict burnout in soldiers Wearables 15 November 2023 byNews Desk
MYIR introduces ARM SoM with Renesas RZ/G2UL processor Boards/Backplanes 14 November 2023 byNews Desk
J784S4XEVM – TDA4AP-Q1, TDA4VP-Q1, TDA4AH-Q1 and TDA4VH-Q1 evaluation module for SoC far-field analytic systems Sensors 14 November 2023 byNews Desk
Hamamatsu new photon-counting head boosts blood testing efficiency Optoelectronics 14 November 2023 byNews Desk
China develop AI chip that’s 3,000 times faster than Nvidia’s A100 Artificial Intelligence 14 November 2023 byNews Desk
AI negotiates a contract, without human intervention Artificial Intelligence 14 November 2023 byNews Desk
Free Python driver enhances test automation experience Test & Measurement 14 November 2023 byNews Desk