Being a certified National Instruments Alliance Partner since April 20th 2010, ITI is one of four category winners of the new “LabVIEW Add-on Award”, presented at this year’s NI Week 2010. The industry’s premier event on graphical system design that took place from August 3-5 in Austin, Texas yearly attracts more than 3,000 engineers, educators, and scientists. Dr. James Truchard, CEO National Instruments, presented Jens O. Schindler, ITI General Manager, with the award during the NIWeek opening ceremony. ITI’s leading multidomain physical plant modeling software platform, SimulationX, was selected best-in-class in the category “LabVIEW Platform Extension” and received an upgrade to silver level within NI’s Compatible with LabVIEW program.
SimulationX is the most intuitive multi-domain modeling software for simulating and analyzing plant models. Via code export, SimulationX models can be directly integrated into NI’s graphical design platforms. The immediate re-use of SimulationX plant models within LabVIEW and NI VeriStand revolutionizes the design process as customers can continuously use their plant models throughout the entire development process – starting from the design and modeling over analysis through to HiL-testing. This way, they save cost and time consuming tests with prototypes and accelerate time-to-market of their latest developments.
“We are very pleased to recognize ITI with the award,” said Jeff Meisel, NI’s LabVIEW Partner Program Manager. “ITI’s ongoing commitment to further developing SimulationX functionality for connectivity with LabVIEW in the field of virtual system simulation and functional testing, coupled with their strong market expertise makes this collaboration exceptional.”
“We are truly honored to be recognized by National Instruments with this award,” said Jens O. Schindler. “Considering our comparably young membership in the NI Alliance Partner community, the award acknowledges that we have really established ourselves as a leading National Instruments partner – one that NI can count upon.”
