It enables the automatic generation of complete application scripts for chip embedded test and measurement instruments, e.g. chip-dependent instrument selection, implementation (for FPGA), addressing, configuration and procedural control as well as qualification of the generated data. Additionally, the software is able to generate scripts for graphical control panels in order to support interactive debugging.
“We have recognized the potential of chip embedded instruments early on, but also analysed the difficulty of their practical utilization within the framework of a universal JTAG/Boundary Scan platform. The new Application Program Generator allows us to provide a completely new level in process automation”, says Thomas Wenzel, Managing Director of GOEPEL electronics’ Boundary Scan Division. “In addition to an increase in project development efficiency, applications become safer and debugging more simple. At the same time, we contribute to intensifying the utilisation of Chip embedded Instruments as part of our corporate philosophy of Embedded System Access.”