Component Management

SEGGER introduce multi-architecture streaming trace probe

15th December 2023
Kristian McCann
0

The new flagship model J-Trace PRO is now the "all-in-one" probe for any popular CPU core and architecture. It combines all the debug capabilities of the market-leading J-Link series with all the analysing, verifying and code-profiling features of the J-Trace series to get a truly one-stop solution.

J-Trace PRO offers multi-platform support (RISC-V, Arm), up to 4 MB/s download speed, and comes with Ethernet and SuperSpeed USB 3.0 interfaces. It ships with every feature enabled, including Unlimited Flash Breakpoints and real-time analysis with the Ozone debugger and performance analyser, at no additional cost.

"Developers have an ever-expanding selection of devices and architectures to choose from for new product designs. We combined all the features of the J-Trace probes into this single top-of-the-line product to get everyone covered for today's and tomorrow's projects," says Ivo Geilenbruegge, Managing Director of SEGGER. "With all features of J-Link and J-Trace - this single compact, fanless unit now does it all. Whatever the challenge, J-Trace PRO has it covered!"

The entire trace system is designed for ease of use. With just a few clicks, a full visualisation of what the application is doing, and where most of the time is spent, is rapidly made available.

The J-Trace PRO captures complete instruction traces and performs unlimited profiling and code coverage over unlimited periods of time, enabling the recording of infrequent, hard-to-reproduce bugs. This is particularly helpful when the program flow 'runs off the rails' and stops in a fault state. Features include streaming trace, Live Code Profiling (providing visibility as to which instructions have been executed and how often, so hotspots can be addressed and optimisation opportunities identified), and Live Code Coverage (so engineers have visibility over which parts of the application code have been executed).

Product Spotlight

Upcoming Events

View all events
Newsletter
Latest global electronics news
© Copyright 2024 Electronic Specifier