Agilent Technologies to Show Latest LTE Test Solutions at LTE Americas 2009

Agilent Technologies has announced it will demonstrate its latest LTE test solutions at the LTE Americas 2009 conference in Dallas, Texas, Nov. 4-5. Demonstrations include Protocol & Device Validation Test, Drive Test, Signal Analyzer and Installation and Maintenance tools for spectrum analysis/cable antenna test.

Agilent is delivering an industry-leading test portfolio for the LTE development lifecycle, said Ron Nersesian, president of Agilent’s Electronic Measurement Group. We have introduced several first-to-market LTE test products to ensure the successful rollout of LTE, and we’re excited to be a part of this significant conference.

LTE Americas, a collaboration between 3GPP and Informa, brings together LTE visionaries across the industry to discuss and debate the key issues surrounding LTE development and deployment. Along with its partners, Agilent provides a broad, comprehensive portfolio of solutions that address the entire UE LTE and eNB lifecycle — from early development through production test and deployment.

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