Analysis

Duo announce LTE UE category Cat-1bis conformance test

30th April 2019
Mick Elliott
0

Rohde & Schwarz and UNISOC have conducted the new LTE UE category Cat-1bis conformance test cases. All validated test cases passed successfully on the DUT with the embedded UNISOC IVY series IoT chipset, thus fulfilling the GCF certification entry criteria.

Rohde & Schwarz says it is the first and, to date, only test and measurement equipment manufacturer to meet the GCF test platform approval criteria (TPAC). The company offers validated test cases for both types of conformance testing with the R&S TS8980 for RF tests and the R&S TS-RRM for radio resource management (RRM) tests. Additional frequency bands have been verified on the used conformance test systems.

At the latest GCF Conformance Agreement Group (CAG) meeting held in Shanghai work items were activated for certification in five currently introduced LTE bands (1, 3, 7, 20 and 28).

The new LTE UE category Cat-1bis corresponds to category 0 known from machine type communications (MTC), but offers data rates as high as category 1. It is consequently suitable for a variety of applications such as wearables or feature phones.

With an uplink rate of 5 Mbps and a downlink rate of 10 Mbps, this highly cost-effective cellular communications technology fills the gap between low-power narrowband IoT and traditional broadband IoT, meeting 80% of today’s IoT application requirements while providing additional solutions for future IoT scenarios.

Wang Bo, General Manager of UNISOC's IoT Device business unit, says: “We are happy to cooperate with Rohde & Schwarz to achieve the certification of devices based on UNISOC’s IVY series IoT chipset. The successful conformance tests will further strengthen our full-scale coverage in the IoT market from traditional 2G/3G/4G to NB-IoT/eMTC. We will continue to join hands with partners to provide users with even more valuable IoT products and solutions.”

Featured products

Upcoming Events

No events found.
Newsletter
Latest global electronics news
© Copyright 2024 Electronic Specifier