French

Extreme Testing
How Bit Error Rate Testing IP can help with verifying high-speed interfaces in production. By Hosea Busse, Applications Engineer, GÖPEL electronic.
Functional test service on parade at IPC APEX EXPO
Single- and double-sided flying probe testers will be the centerpiece of ACD’s stand at the IPC APEX EXPO in San Diego (Feb. 24-26). The company’s assembly business model supports high-mix, high-technology assembly from prototypes through low-to-mid volume production to offer its customers confidence in receiving quality, defect free assemblies.
Infrared pyrometer measures temperatures down to 350 degrees C
The new PyroMini 0.9 infrared pyrometer makes it possible to measure the temperature of reflective metals and semiconductors, as low as 350°C, at low cost and without contact. The pyrometer can view into a vacuum chamber through a quartz or glass window, and measure the temperature of the surface of the silicon wafer.

eBook highlights JTAG boundary-scan role in board test
Circuit boards with self-healing buses like Intel QuickPath Interconnect (QPI) can be a challenge to test and assure board quality unless JTAG boundary-scan (IEEE 1149.1) tests are included in manufacturing, according to a new eBook from ASSET InterTech. ASSET is a leading supplier of debug, validation and test tools based on embedded instrumentation for software, chips and systems.

Test tool integrated with static analysis software
Vector Software has integrated VectorCAST and Polyspace static analysis products from MathWorks. The collaboration enables developers to combine dynamic testing and static analysis in a single, seamless environment which helps to ensure applications function as intended. Polyspace products can be launched from the VectorCAST graphical user interface (GUI), enabling static analysis of Ada, C or C++ files. By using the two tools in tandem, develope...
Arbitrary waveform generators get frequency upgrade
B&K Precision has upgraded its 4075B Series of arbitrary/function waveform generators with higher frequency ranges, increased arbitrary memory, and a colour LCD. The new 4075B Series offers six new models that directly replace the previous 4075 line with single- and dual-channel 30 MHz (4075B/4078B) and 50 MHz models (4076B/4079B) along with two additional single- and dual-channel 80 MHz models (4077B/4080B).

Handler enables memory testing productivity gains
Advantest has combined improved positioning accuracy higher throughput and tighter temperature control in its new M6245 test handler. The system incorporates the company’s latest advances for handling double data rate (DDR) and Flash memory devices. The test handler incorporates a visual-alignment system that improves test yields by achieving contact accuracy to within 0.3 mm ball pitch.
Probes, software on parade at Farnborough event
At Southern Manufacturing & Electronics, the Peak Group is featuring its range of automated test & measurement solutions along with probes, test accessories and bespoke software development capabilities. Peak supplies a comprehensive range of test equipment, from simple test boxes used by subcontract manufacturers to stand-alone high-specification test racks and systems used in the aerospace and defence industries.
Mini spectrometer module targets inline testing
The latest offering from Hamamatsu Photonics in its range of miniature spectrometers is the C11697MB; a high-sensitivity, trigger-compatible VIS-NIR mini-spectrometer module. The new module is ideal for inline testing applications and measurement of pulsed light emission due to the high sensitivity offered by the new S11639 CMOS linear image sensor housed inside.

Starter kit eases introduction to JTAG test, debugging
Engineers looking for a quick and easy start on JTAG test and debug can now use a starter kit launched by Corelis. The JTAG Starter Kit is a new value-oriented bundle that combines the advanced capabilities of ScanExpress Debugger with a portable USB 2.0 JTAG controller and includes 12 full months of support and software updates.