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Extreme Testing

How Bit Error Rate Testing IP can help with verifying high-speed interfaces in production. By Hosea Busse, Applications Engineer, GÖPEL electronic.
27th March 2015

Functional test service on parade at IPC APEX EXPO

Functional test service on parade at IPC APEX EXPO
Single- and double-sided flying probe testers will be the centerpiece of ACD’s stand at the IPC APEX EXPO in San Diego (Feb. 24-26). The company’s assembly business model supports high-mix, high-technology assembly from prototypes through low-to-mid volume production to offer its customers confidence in receiving quality, defect free assemblies.
21st January 2015

Infrared pyrometer measures temperatures down to 350 degrees C

Infrared pyrometer measures temperatures down to 350 degrees C
The new PyroMini 0.9 infrared pyrometer makes it possible to measure the temperature of reflective metals and semiconductors, as low as 350°C, at low cost and without contact.  The pyrometer can view into a vacuum chamber through a quartz or glass window, and measure the temperature of the surface of the silicon wafer.
11th January 2015

eBook highlights JTAG boundary-scan role in board test

Circuit boards with self-healing buses like Intel QuickPath Interconnect (QPI) can be a challenge to test and assure board quality unless JTAG boundary-scan (IEEE 1149.1) tests are included in manufacturing, according to a new eBook from ASSET InterTech. ASSET is a leading supplier of debug, validation and test tools based on embedded instrumentation for software, chips and systems.
19th December 2014

Test tool integrated with static analysis software

Vector Software has integrated VectorCAST and Polyspace static analysis products from MathWorks. The collaboration enables developers to combine dynamic testing and static analysis in a single, seamless environment which helps to ensure applications function as intended. Polyspace products can be launched from the VectorCAST graphical user interface (GUI), enabling static analysis of Ada, C or C++ files. By using the two tools in tandem, developers can find bugs, prove absence of critical run-time errors, identify dead code, and perform dynamic testing to verify functional correctness.
14th December 2014

Arbitrary waveform generators get frequency upgrade

Arbitrary waveform generators get frequency upgrade
B&K Precision has upgraded its 4075B Series of arbitrary/function waveform generators with higher frequency ranges, increased arbitrary memory, and a colour LCD. The new 4075B Series offers six new models that directly replace the previous 4075 line with single- and dual-channel 30 MHz (4075B/4078B) and 50 MHz models (4076B/4079B) along with two additional single- and dual-channel 80 MHz models (4077B/4080B).
1st December 2014

Handler enables memory testing productivity gains

Advantest has combined improved positioning accuracy higher throughput and tighter temperature control in its new M6245 test handler. The system incorporates the company’s latest advances for handling double data rate (DDR) and Flash memory devices. The test handler incorporates a visual-alignment system that improves test yields by achieving contact accuracy to within 0.3 mm ball pitch.
1st December 2014

Probes, software on parade at Farnborough event

Probes, software on parade at Farnborough event
At Southern Manufacturing & Electronics, the Peak Group is featuring its range of automated test & measurement solutions along with probes, test accessories and bespoke software development capabilities. Peak supplies a comprehensive range of test equipment, from simple test boxes used by subcontract manufacturers to stand-alone high-specification test racks and systems used in the aerospace and defence industries.
26th November 2014

Mini spectrometer module targets inline testing

Mini spectrometer module targets inline testing
The latest offering from Hamamatsu Photonics in its range of miniature spectrometers is the C11697MB; a high-sensitivity, trigger-compatible VIS-NIR mini-spectrometer module. The new module is ideal for inline testing applications and measurement of pulsed light emission due to the high sensitivity offered by the new S11639 CMOS linear image sensor housed inside.
19th November 2014

Starter kit eases introduction to JTAG test, debugging

Engineers looking for a quick and easy start on JTAG test and debug can now use a starter kit launched by Corelis. The JTAG Starter Kit is a new value-oriented bundle that combines the advanced capabilities of ScanExpress Debugger with a portable USB 2.0 JTAG controller and includes 12 full months of support and software updates.
18th November 2014

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