Companies

ZEISS

ZEISS Articles

Displaying 1 - 16 of 16
Optoelectronics
9th April 2020
Enhancing efficiency in multi-scale workflows

Materials and Life Science researchers can now experience faster accessibility of deeper regions of interest when investigating samples in 3D in multi-scale workflows.

Optoelectronics
6th January 2020
Four new models introduced for light microscopy applications

ZEISS has introduced four new high-quality CMOS cameras for digital imaging in light microscopy. These cameras complete the portfolio of proven ZEISS Axiocam models which stand for high performance in demanding microscopy applications. 

Optoelectronics
18th November 2019
Four models introduced for light microscopy applications

ZEISS has introduced four new high-quality CMOS cameras for digital imaging in light microscopy. These cameras complete the portfolio of proven ZEISS Axiocam models which stand for excellent performance in demanding microscopy applications. 

Optoelectronics
8th February 2019
Platform for gentle 3D superresolution microscopy

It has been announced that ZEISS is introducing ZEISS Elyra 7 with Lattice SIM, a new flexible platform for fast and gentle 3D superresolution. Lattice SIM expands the possibilities of structured illumination microscopy (SIM): illuminating the sample with a lattice pattern rather than grid lines gives higher contrast and allows a more robust image reconstruction.

Design
12th December 2018
Software modules with enhanced imaging technology

New software modules with enhanced imaging technology has been introduced by ZEISS. The ZEISS ZEN Connect is useful for structural analysis, examination of cellular processes, and localisation of cells. The ZEISS ZEN software combines functions for day-to-day work with microscopes and stands for scientific success. The ZEISS ZEN Connect module enhances research by introducing three new features.

Design
12th December 2018
Mineralogic v1.6 offers a range of capabilities

The release of the ZEISS Mineralogic software at the Process Mineralogy '18 conference in Cape Town, South Africa. This is the 7th instalment of ZEISS Mineralogic since the software was brought to the market in July 2014 and represents a significant advancement in both features and productivity.

Optoelectronics
14th September 2018
Tomographic imaging with faster results for geologists

The new module for the ZEISS Xradia Versa 500-series of 3D X-ray microscopes (XRM) will allow users to acquire high quality images in one-quarter the time. ZEISS OptiRecon uses an advanced iterative reconstruction technique. You can make the optimal choice for your requirements: same quality images four times faster, or superior quality in the same amount of time.

Design
14th March 2018
Machine learning capability enables correlative microscopy datasets

The recently announced ZEISS ZEN Intellesis, a new machine learning capability from ZEISS enables researchers to perform advanced analysis of their imaging samples across multiple microscopy methods. The first algorithmic solution introduced by the ZEISS ZEN Intellesis platform makes integrated, easy to use, powerful segmentation for 2D and 3D datasets available to the routine microscopy user. ZEISS ZEN Intellesis software is available for t...

Analysis
15th February 2018
Laboratory-based x-ray microscopy solution for materials science

An exclusive strategic partnership agreement has been signed between ZEISS Microscopy business group and Denmark-based Xnovo Technology ApS, a company that develops innovative software-based 3D X-ray imaging and analysis solutions. The two companies have already been working together over the past two years. This strategic partnership is targeting to further advance and expand the laboratory-based diffraction contrast tomography technique, c...

Analysis
6th February 2018
Strategic partnership signed for material science

It has been announced that the ZEISS Microscopy business group has signed a strategic partnership agreement with Denmark-based Xnovo Technology ApS, a company that develops innovative software-based 3D X-ray imaging and analysis solutions. The two companies have already been working together over the past two years. This strategic partnership is targeting to further advance and expand the laboratory-based diffraction contrast tomography tech...

Power
10th January 2018
Advancing the next generation of batteries

To study the inner-workings of batteries and fuel cells, the Electrochemical Innovation Laboratory (EIL) at University College London (UCL) is using ZEISS Xradia 810 Ultra X-ray microscopy. ZEISS Xradia 810 Ultra enables the team of researchers to study the evolution of microstructure down to 50nm resolution, revealing the fine details of lithium ion batteries in 3D.

Test & Measurement
29th July 2017
Focused ion beam scanning electron microscope

The ZEISS Crossbeam 550 is said to feature a significant increase in resolution for imaging and material characterization and a speed gain in sample preparation. Nanostructures such as composites, metals, biomaterials or semiconductors can be investigated with analytical and imaging methods in parallel.

Events News
14th June 2017
Microscopes and imaging solutions on show at SEMICON West 2017

At SEMICON West 2017, taking place from 12th to 14th July 2017 at the Moscone Center, San Francisco, ZEISS will be highlighting a range of microscopes and imaging solutions. Visitors to booth 5214 will see product stations featuring ZEISS Xradia 520 Versa 3D X-ray microscope, ZEISS ORION NanoFab helium ion microscope, ZEISS SteREO Discovery.V20 modular stereo microscope, ZEISS Stemi 508 stereo microscope, ZEISS Smartzoom 5 automated digital ...

Test & Measurement
13th April 2017
High resolution FIB-SEMS announced by Zeiss

The latest ZEISS  focused ion beam scanning electron microscopes (FIB-SEMs) are said to feature a significant increase in resolution for imaging and material characterization and a speed gain in sample preparation. Nanostructures such as composites, metals, biomaterials or semiconductors can be investigated with analytical and imaging methods in parallel. ZEISS Crossbeam 550 allows simultaneous modification and monitoring of samples, resulti...

Analysis
10th March 2017
Xradia Versa has FPX for extended ‘Scout and Zoom’ imaging

The ZEISS FPX flat panel extension for the ZEISS Xradia Versa 500-series of 3D X-ray microscopes delivers large-sample, high throughput scanning with best-in-class image quality. Combined with the high resolution of ZEISS Xradia Versa X-ray microscopes (XRM), the new ZEISS FPX enhances imaging flexibility and creates workflow efficiencies with an all-in-one system for industrial development and academic research.

Optoelectronics
9th February 2017
Microscope cameras equipped with scientific CMOS sensor

Two new digital microscope cameras have been introduced by ZEISS. The ZEISS Axiocam 702 mono and ZEISS Axiocam 512 colour complement the current portfolio of high-speed USB 3.0 microscope cameras. With ZEISS Axiocam 702 mono ZEISS for the first time introduces a microscope camera with a scientific CMOS sensor. 

First Previous Page 1 of 1 Next Last

Featured products

Upcoming Events

View all events
Newsletter
Latest global electronics news