In this free online event, Rohde & Schwarz and partner companies will offer application-oriented presentations via live stream.
The focus will be on challenges that electronics engineers face when using test and measurement equipment such as oscilloscopes.
The webcasts will be streamed in English, French, German, Spanish, and Portuguese.
Robert Schillinger, Field Application Engineer, will represent Würth Elektronik eiSos with his presentation, “Which RF Effects Need to be Considered in the Measurement and Design of Wide-bandgap Semiconductor-Based Power Systems?”.
The presentation will focus on power electronics utilising SiC and GaN transistor technology, a topic being researched for many years at Würth Elektronik.
Schillinger will share with Oscilloscope Days participants the latest findings on filtering gate drivers.
Other topics at the event include the selection of suitable measurement equipment, jitter analysis, signal integrity, and EMC troubleshooting.