Test & Measurement

W1 component line for high-speed design test requirements

29th June 2020
Alex Lynn

Anritsu Company has expanded its W1 component line with the introduction of bias tees, DC block, and semi-rigid cables that operate to 110 GHz and provide broadband frequency scalability in high-frequency device characterisation and optical networking applications.

The addition of the new W1 components has provided Anritsu with a broad millimeter wave (mmWave), coaxial component portfolio, and they can be integrated in test systems, so engineers have greater confidence in their emerging high-speed designs. 

W1 components support high frequencies

Anritsu’s component technology in millimeter wave (mmWave) frequencies is re-enforced with the introduction of the W1 components. No other company has a more complete set of 110GHz components for frequency and time domain use.

With operable frequency of DC to 110 GHz, the new W1 components generate metrology-grade quality results with high repeatability. Further ensuring flexibility for customer testing, these new components provide a component solution where conventional devices, including waveguide, do not exist. The W1 coaxial interface allows for a direct connection to the instrument test port, which saves time and simplifies system setup.

The new components can be used as part of a test system consisting of 110 GHz vector network analysers (VNAs), oscilloscopes and Bit Error Rate Testers (BERTs), as well as for optical transceivers, laser diodes, photodiodes and optical modulators. Development of switches and routers using NRZ and PAM4 modulation schemes with 56Gbps and 112Gbps data rates, and 800G technology are applications, as well.

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