RF semiconductor devices are key components in many of today’s consumer electronics devices. The drive for smaller form factors and reduced manufacturing cost is leading semiconductor makers to integrate more RF functions onto a single chip that supports multiple communication protocols. The reliable and economic mass production of these ICs, which contain an increasing number of RF ports with greater RF bandwidth, requires advanced testing capabilities that deliver low cost-of-test.
Verigy’s V93000 Port Scale RF system provides up to 96 RF ports and octal-site parallel test capability, with high multi-site efficiency to deliver best-in-class throughput and low cost-of-test. This scalable tester can be configured with the desired capabilities and price points for each customer’s specific needs. It can test devices ranging from low-integration devices such as power amplifiers, tuners, and transceivers up to high-integration RF devices containing integrated mixed-signal, digital, power management and embedded or stacked memory. In addition, the V93000’s versatile architecture allows customers to use the same test platform across all of their RF and SOC product lines, reducing the need for multiple test platforms for different application segments.
“The scalability of our Port Scale RF system gives our customers the flexibility to address the various implementations of RF device partitioning, from high-integration devices to low-integration devices, and anywhere in between,” said Hans-Juergen Wagner, Verigy’s vice president of SOC test solutions. “This demonstrates once again the unprecedented ability of the V93000 platform to deliver the most cost-effective solutions for a wide variety of applications, achieving the highest return on investment for our customers by maximizing utilization.”
