Pickering Interfaces will unveil a new range of MEMS-based MultiGBASE-T1 fault insertion units (FIUs) at next week’s Automotive Testing Expo North America in Novi, Michigan.
The UK-headquartered test and measurement company will showcase the new PXI and PXIe FIUs—designed for high-speed automotive Ethernet testing—alongside its broader portfolio of modular signal switching and sensor simulation products at booth 9003.
According to Steven Edwards, Head of Product Management at Pickering, the new modules employ microelectromechanical systems (MEMS) technology to address the bandwidth demands of emerging automotive Ethernet standards. “Capability limitations mean that the high-speed bandwidth requirements of the latest MultiGBASE-T1 automotive Ethernet protocols cannot be supported with reed relays or electromechanical relays,” Edwards said. “Our MEMS-based design delivers the highest bandwidth FIUs we have produced to date.”
The Automotive Testing Expo is the leading North American event for vehicle testing, development, and validation technologies. More than 250 exhibitors will demonstrate systems and equipment for applications including ADAS and autonomous vehicle testing, electric and hybrid powertrains, aerodynamics, EMI and NVH analysis, and durability testing.
Pickering’s stand will also feature a Automotive Testing Expo North America (HIL) battery management system (BMS) demonstration. The setup will include a PXI battery simulator for stacked battery architectures, a fault insertion module to emulate shorts and broken connections, and various high-power PXI switching modules housed within an LXI chassis.
The company will additionally highlight new 5A battery simulator modules, high-voltage switching units, and its modular chassis systems that allow PXI modules to be controlled remotely via Ethernet. Supporting accessories such as custom cabling and connectors—designed with Pickering’s online Cable Design Tool—will also be shown, alongside reed relays from its sister company, Pickering Electronics.
The Automotive Testing Expo North America takes place at the Suburban Collection Showplace, Novi, Michigan, from 21st to 23rd October 2025.
