Test & Measurement

Two Nordson companies to show at NEPCON South China

31st July 2016
Peter Smith

Nordson DAGE and Nordson MATRIX will exhibit at NEPCON South China (Aug 30-Sept 1).  Nordson DAGE will showcase its 4th generation, ultra-high resolution, off-line MXI X-ray system – the Quadra 7 and 4000Plus Bondtester while Nordson MATRIX will showcase its high-speed X3 Inline AXI system.

Nordson DAGE’s Quadra 7 with 0.1μm sub-micron feature recognition – comes equipped with two 4K UHD displays and 8 million pixels to fully show the 50μm pixel pitch and 6.7MP image size of the Aspire FP detector.

Nordson DAGE will also highlight its 4000Plus Bondtester with Camera Assist Automation, ideally suited for pull-and-shear testing of wafer interconnections, lead frames, hybrid microcircuits or automotive electronic packages. 

The Nordson MATRIX X3 is an automated inspection system designed for sophisticated high-speed inspection in SMT production. Transmission X-ray Technology with patented Slice-Filter-Technique (SFT), Off-Axis technology and 3D SART present a flexible solution package for the in-line inspection of single & double-sided PCB assemblies. The X3 movable detector axes allow high-speed off-axis image acquisition from different angles and directions with maximum image quality and resolution.

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