“Our semiconductor customers asked for an alternative to big-iron ATE systems that would combine the features of high-end ATE with the open architecture and benefits of the PXI standard,” said Steve Sargeant, CEO of Marvin Test Solutions. “Our TS-960 platform which incorporates our advanced GX5296 digital subsystem and associated software tools offers customers the flexibility and value of the PXI platform with the high-performance test capabilities typically found only in high-end ATE systems.”
Available as a bench top or with an integrated manipulator, the TS-960 platform takes full advantage of the PXI architecture to achieve a full-featured test solution for digital, mixed – signal or RF test applications.
The GX5296 delivers high-performance digital test capabilities and is ideal for addressing verification, focused production, and failure analysis test needs – or for replacing legacy test systems. It builds on the GX5295 PXI digital subsystem, offering unrivaled timing, density, memory, and sub-nanosecond timing per pin capabilities.
And with the addition of MTS’ advanced software tools for program development / debug and comprehensive file conversion tools for WGL, VCD/eVCD, STIL , and ATP formats; the TS-960 provides no-compromise digital / mixed-signal test capabilities for component, SoC and SiP devices.