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Sensor-To-Bits: Simplifying DAQ Design
Test Card Measures Mobile Functions in Extreme Conditions
PXI Chassis Offer More Slots, Bench-Top Use

Test Card Measures Mobile Functions in Extreme Conditions

COMPRION’s new test card helps confirm the proper functioning of mobile phones in extreme temperature zones, from the Arctic to the Sahara. M2M UICCs are perfect for devices that must perform in rough environments and meet extended lifetime expectations. Such devices can be used anywhere on earth, i.e. making a call from a car in the middle of the desert, or sending data from an Arctic weather station.
20 May 2013
byNews Desk

The new 64K/J LTE Test (U)SIM – M2M UICC examines mobile device behaviour at temperatures between -40°C to +105°C, instead of the previously-required -25°C to +85°C. Thus, the card meets the ETSI specification TS 102 671.

Additionally, the M2M Test (U)SIM includes new LTE data fields and carries a GSM and a USIM application. The card supports 1.8V, 3V and 5V voltage classes and is available in the Plug-In/2FF format.

20 May 2013
byNews Desk

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Sensor-To-Bits: Simplifying DAQ Design

20 May 2013
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PXI Chassis Offer More Slots, Bench-Top Use

20 May 2013

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