Software accelerates semiconductor test process
A major system software update (KTE version 5.6) for the Keithley S530 Parametric Test System that can reduce measurement speed by as much as 25 percent has been released by Tektronix. This translates into increased wafer-level test throughput and directly improves the S530’s cost of ownership (COO) for semiconductor production and R&D departments.
Lower manufacturing costs and increased yields are key goals for semiconductor production companies who must also deal with evolving materials and device structures. In-line parametric test throughput and overall COO are directly related to the time it takes to complete all necessary measurements across semiconductor wafers.
The software upgrade for the S530 includes enhancements to system SMUs that reduce settling time associated with low current measurements. Faster current measurements result in faster overall system measurement speeds.
New system measurement settings and streamlined software execution further improve system speed.
The upgrade also includes integration of Tektronix’ newest Keithley digital multimeter to enable faster low voltage and low resistance measurements.
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