DELTA’s temperature handler allows running test cycles between extremely high (+175°C) and extremely low ( 55°C) temperatures with full temperature control during tests. The Tri-Temp Pick and Place Handler offers throughput up to 5,300 units per hour for device sizes from 2×2 to 70×70mm.
The new handler extends DELTA’s European test facilities for testing analogue, digital, mixed signal and RF components. DELTA’s semiconductor test lab includes wafer probers, component handlers using ATE (Automatic Test Equipment), qualification services and failure analysis lab.