Additionally, the new software application uses Gerber data files rather than CAD, which can sometimes be difficult for customers to obtain.
Key features include component libraries as well as reverse net generation, providing valuable component connectivity information and empowering the customer to create highly efficient test programs. The Hioki UA1780 Fit-Line application is backwards compatible with the previous generation Hioki 1240 Flying Probe Testers.
The Fit-Line Inspection Data Creation System will be in full operation on the HIOKI FA1240 Flying Probe Tester in Booth 2433 at the IPC APEX EXPO in Las Vegas from March 25-27.
