ScanExpress JET utilizes a processor’s JTAG debug port to download and command execution of microprocessor coded test steps which enable at-speed functional testing of the processor and all major peripheral interfaces. ScanExpress JET also provides an integrated development environment allowing users to create or import their own scripted test cases through a simplified graphical user interface. Benefits of using ScanExpress JET for TI Sitara ARM microprocessors include: Standardized interface tests for SDRAM memory, I2C, Ethernet, PMIC, and UART Fast in-system programming and testing of parallel and serial NOR and NAND Flash Automatic test development for supported peripherals Integrated scripting environment for test customization
No boot code requirement for test execution
The IEEE-1149.1 JTAG standard has quietly evolved to close the test coverage gaps created by technology miniaturization and high-speed interfaces,‖ states Ryan Jones, Senior Technical Marketing Engineer at Corelis. ―Processor driven test solutions, such as ScanExpress JET, are able to remove the necessity of having a large number of JTAG devices on a board to justify JTAG testing—a single MPU is often adequate. Applications for Texas Instruments Sitara ARM microprocessors represent the typical high performance, low accessibility case where they are the only JTAG device in a design making them great candidates to apply this technology.
Sitara microprocessors are utilized in applications such as retail point-of-sale terminals, industrial automation, human machine interfaces, single-board computing, network storage, and network printing. ScanExpress JET for TI Sitara ARM microprocessors is designed to provide engineers with a ready-to-use solution that helps speed up their design, development, and test processes.