Jitter Analysis Option Enhances Oscilloscope Performance

22nd May 2013

ES Admin

0 0

Datasheet

Jitter measurements are important when developing circuits with serial high-speed data interfaces such as USB 2.0 and HDMI. One particular challenge is the signal's embedded clock that is used as a time reference. Rohde & Schwarz has addressed this requirement with new options for its R&S RTO high-performance oscilloscope.

The oscilloscope features an impressive low-noise front-end, high dynamic range ADC, high acquisition and analysis rate and a digital trigger system with extremely low trigger jitter. In addition to automatic jitter measurements, the new R&S RTO-K12 jitter analysis option offers a wide range of intelligent functions. A wizard-driven menu assists users with the most important measurements in order to obtain quick results. Configurable software clock data recovery (CDR) was implemented for the automatic time interval error (TIE) measurement function. The track function shows the progression of measured values and their time correlation with the trace, opening up additional analysis options. Geometric box elements help users quickly create mask tests.

The new option's configurable hardware CDR is integrated into the oscilloscope's ASIC. This fully-integrated solution is the first to enable users to perform realtime triggering and signal analysis based on the embedded clock. Signal integrity on serial high-speed interfaces can be analyzed at a speed of up to 5 Gbps. Histograms and mask tests quickly return reliable results.