Alternative solutions based on clamps have been developed, but they are not very durable and run the risk of damaging the surface of the blade connector.
With the new P762/G, a slotted and twist-proof contact head is moved over the contact blade, and the compression of the plunger leads to a twisting movement. This results in the contact head getting a good and smooth contact to the item under test without damaging or scratching the surface.
A single P762/G probe can handle currents up to 40 A, depending on the ambient temperature. By using several probes in parallel, even higher currents are possible.