Probe Overcomes Flat Blade Connector Contact Problem
The new P762/G from Peak Test Services is a test probe specifically designed for applications requiring high-current contacting with flat blade connectors. The new probe overcomes the difficulties previously encountered in contacting flat blade connectors with high currents, which result from the fact that the front face does not provide enough contact surface area.
Alternative solutions based on clamps have been developed, but they are not very durable and run the risk of damaging the surface of the blade connector.
With the new P762/G, a slotted and twist-proof contact head is moved over the contact blade, and the compression of the plunger leads to a twisting movement. This results in the contact head getting a good and smooth contact to the item under test without damaging or scratching the surface.
A single P762/G probe can handle currents up to 40 A, depending on the ambient temperature. By using several probes in parallel, even higher currents are possible.
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APV1111GVY
Panasonic
Panasonic PhotoMOS® Photovoltaic MOSFET High-Power Drivers
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| Stock: | 3490 |
| Cost: | $3.95 |
