Turing test: Pet Shop Boys’ new album explores Alan Turing’s legacy ES BlogNews & AnalysisSTEM News 2 October 2026
Turing test: Pet Shop Boys’ new album explores Alan Turing’s legacy ES BlogNews & AnalysisSTEM News 2 October 2026
Software package provides test and simulation for CAN/FMS systems Test & Measurement 10 January 2008 byNews Desk
Keithley Software Offers New Parallel Test and Parametric Die Sort Features for Higher Throughput Test & Measurement 10 January 2008 byNews Desk
Sixteen-channel ‘scope and chart recorder has high resolution printer built in Test & Measurement 10 January 2008 byNews Desk
NI Introduces Sound and Vibration Tools for Interactive, Configurable Data Acquisition and Analysis Test & Measurement 9 January 2008 byNews Desk
TEM cells said to be ideal for calibrating field strength meters Test & Measurement 2 January 2008 byNews Desk
RF measurement facility reduces system development time for customers Test & Measurement 17 December 2007 byNews Desk
Vehicle serial bus analyser performs waveform measurement and protocol analysis Test & Measurement 13 December 2007 byNews Desk
Aeroflex enhances conformance test systems for A-GPS location services Test & Measurement 12 December 2007 byNews Desk
DC current transducers for bipolar measurement of high DC currents Test & Measurement 5 December 2007 byNews Desk
Wideband power sensor for radar and digital communications testing to 18 GHz Test & Measurement 5 December 2007 byNews Desk
PCI Express series extended with 2-channel, 125 MS/s 8-bit Arbitrary Waveform Generator Test & Measurement 4 December 2007 byNews Desk
10m Chamber is the UK’S largest CISPR 16 Semi Anechoic Chamber says 3C Test & Measurement 3 December 2007 byNews Desk
Aeroflex adds A5/3 encryption support to its 6113 basestation tester Test & Measurement 29 November 2007 byNews Desk
3C Test Gain UKAS Accreditation for Military Equipment Test & Measurement 29 November 2007 byNews Desk
PCI Express card family with 4-channel 50 MS/s 8-bit digitizer / oscilloscope Test & Measurement 27 November 2007 byNews Desk
Arbitrary/function generators gain longer memory and system connectivity Test & Measurement 21 November 2007 byNews Desk
ATE System features fully-integrated JTAG/Boundary Scan Test & Measurement 16 November 2007 byNews Desk