Currently, MEMS products for consumer electronics come with the I2C/SPI interface. In order to optimize production efficiency, MEMS companies are desperately looking for a new, low-cost ATE generation with the I2C/SPI interface and parallel-testing capability.
MEMS Test Challenge
Motion sensor needs to accelerate while seating into a DUT board during sensitivity test. Thus, the handler and rotator become a key investment for MEMS testing. Mechanical movement or rotation definitely requires extra test times. In order to help solve this issue, OpenATE has designed and manufactured a powerful QSPI test module which not only preserves all test functions of a traditional IC tester but also provides the I2C/SPI interface, parallel-testing capability. Each QSPI card can test four sites simultaneously with the best performance and lowest cost.
OpenATE’s 16-site system for complete lowest-cost motion sensor (gyroscope/accelerometer) test solutions includes:
• OpenATE Software: MTS2 (Free Download)
• I2C: QSPI x 4
• DPS: PEMU32
• Chassis: NI PXI-1033
• Handler Interface: NI GPIB
In short, PXI-based ATE system with OpenATE’s QSPI can provide users with the following benefits:
1. Smallest Size, Lowest Cost
• Only one five-slot chassis can provide complete 16-site DC/Function
• Adding one more chassis, users can expand as many test sites as needed
2. Simplest ATE Test Software Platform
• MTS2 software platform is easy to connect and integrate with other handlers and rotators
• MTS2 C/C++ development environments are very common and popular for users
• MTS2 with one test program can provide multi-site test functions. Only one test program can test any amount of DUT.
3. Most Flexible Test Platform
• To adjust test instruments to apply to others MEMS productions
• One PXI based standard platform can reduce investment and save cost