One-box LTE-A base station tester unveiled
Aeroflex has launched an extended version of its TM500 industry-standard base station tester capable of emulating several thousand LTE user equipments (UE), fading channel models, and LTE-A carrier aggregation functionality in a one-box benchtop unit. The TM500 Test Mobile is claimed to have a higher UE density than any other solution on the market.
“Carrier aggregation allows operators to achieve the wider channel bandwidths and higher data rates needed to offer true 4G services,” said Ngwa Shusina, product manager at Aeroflex. “The LTE-A features provided by the compact one-box TM500 allow cellular infrastructure vendors to develop carrier aggregation capability and to emulate real network traffic across thousands of terminals, ahead of the widespread availability of real LTE-A handsets.”
LTE-A carrier aggregation was first supported on the TM500 in early 2012, and has since been used by operators worldwide to demonstrate the real-world performance of carrier aggregation technology in field environments. Aeroflex’s LTE product line includes a complete range of end-to-end test systems that cover R&D, performance, service, and manufacturing test applications for LTE TDD and FDD network equipment and terminals.
The TM500 Test Mobile family is in use with almost every base station manufacturer across the world, and can be regarded as the de facto standard for eNodeB development and testing. E500 is the only network capacity test solution that incorporates the TM500 LTE air interface.
The 7100 LTE Digital Radio Test Set is a complete one-box test system providing all the tools required for the measurement and characterisation of user equipment (UE) chip sets and mobile terminals to 3GPP LTE standards, including optional signal fading simulation.
The PXI 3000 Series, modular RF test system based on PXI technology is a proven solution to accelerate throughput in manufacturing and time to market in R&D while catering for current and future RF test needs. It is particularly suited to modern cellular and wireless data communications and critical testing in a high volume manufacturing environment.