“NI continues its strong investment in RF and microwave instrumentation expanding the adoption of PXI into high-end applications,” said Jin Bains, Vice President of RF Research and Development at National Instruments.
“The extensive feature set of the NI PXIe-5632 VNA significantly reduces the cost of network measurements, especially in high-volume automated test applications that require highly accurate measurements, a fast measurement speed and a small footprint.”
Product Features:
• Two-port, 3-slot PXI Express VNA with frequency coverage from 300 kHz to 8.5 GHz
• Wide power range from -30dBm to +15dBm settable in 0.01dB steps for measuring compression and s-parameters of active devices • Dual-source architecture with source access loops for pulsed S-parameter measurements and extended source power range.
• Frequency offset capability using independently tuned sources for measuring frequency translation devices and hot S-parameters • Industry-leading programming interface for NI LabVIEW, ANSI C and .NET for simplified programming and fast test development times while maintaining RF measurement quality