This new test handling process differs from traditional tube or tray loading of devices into gravity feed and pick-and-place systems. Instead, singulated devices are loaded into a patented micro-spring carrier frame that is handled on Multitest’s strip handling system.
With the InCarrier® device transfer system, Multitest can achieve very high test parallelism for singulated devices without compromising quality through post test singulation processing. The actual test handling is practically jam free, even for devices as small as QFN 2 mm x 2 mm, and thus warrants unprecedented tester utilization.