Module enables testing of hi-res audio devices

The module’s measurement technique performs over an ultra-high dynamic range, achieving accuracy in analogue testing from device characterisation to mass production without requiring complex performance boards or additional test and measurement instruments on the T2000 test platform.

High-resolution audio features both a wider dynamic range and an improved sound source compared to CDs.

The proliferation of electronic devices capable of supporting high-resolution audio – including smart phones, wireless audio components for wearable electronics and home theaters, automotive navigation systems, gaming consoles, 4K and 8K televisions, and other next-generation products – has led to an increase in the number of PMICs with embedded digital-to-analog converters (DACs), which require high-dynamic-range testing with 24-bit or 32-bit resolution.

When used on the T2000 platform, the module provides the versatility to test both PMICs and high-resolution audio DACs using the same system configuration. This helps users to save on their capital investments while also reducing test cycle times.

Upward compatibility and the high-resolution functionality of its digitiser enable measurements with both a signal-to-noise ratio (SNR) and a dynamic range (DR) of 130dB. In addition, the unit’s massive parallel site testing capability leverages twice the number of sites compared to other systems on the market, resulting in higher throughput and a lower cost of test.

The GPWGD high-resolution module’s extendible design allows it to be seamlessly integrated into either laboratory or production environments for existing device types as well as new high-resolution audio ICs.