Test & Measurement
LeCroy - Single-Source Comprehensive SuperSpeed USB Test Suite
LeCroy has announced the launch of a single-source lineup of test instruments to comprehensively support the USB (Universal Serial Bus) 3.0 standard, also known as SuperSpeed USB. The LeCroy USB 3.0 Test Suite is an integrated selection of test instruments that addresses all transmitter, receiver, TDR and protocol tests currently defined in the Universal Serial Bus 3.0 specification.The
“Through LeCroy’s leadership in oscilloscope and protocol analyzer technology, we have developed the first complete single-source suite of SuperSpeed USB test solutions for developers’ physical and protocol layer testing needs,” said LeCroy Vice President and Chief Technology Officer David Graef. “LeCroy’s QualiPHY automated compliance test software is the only solution available that fully integrates transmitter and receiver testing, by simultaneously controlling both the SDA 813Zi oscilloscope and the PeRT3 to produce a full compliance report with transmitter and receiver results.”
LeCroy’s PeRT3 is the only tool that can manage issues such as the insertion or deletion of SKP symbols without losing lock during automated testing programs and correctly measure BER (bit error rate). Because the PeRT3 combines the functions and features of a signal generator, bit error rate tester (BERT), protocol editor and serial data analysis system into one instrument, it is able to fully characterize the receiver tolerance envelope through the controlled introduction of various types and levels of signal stress (e.g., increased jitter) while monitoring signal integrity.
In addition, the LeCroy USB 3.0 Test Suite includes the preeminent solution for USB 3.0 compliance verification, the Voyager protocol analyzer exerciser system. A full function analyzer, it is capable of recording and analyzing traffic between both USB 2.0 or 3.0 devices. The integrated exerciser can emulate USB 3.0 device behaviors to allow functional, reliability, and performance testing.
“USB 3.0 introduces low latency flow control and aggressive power management policies that will require thorough testing as part of the USB 3.0 compliance program,” says Jim Kuo, Senior Digital Design Manager at JMicron. “LeCroy’s Voyager verification system provides visibility to the logical SuperSpeed packets. The Exerciser option gives us precise link layer control, allowing us to test marginal timing conditions that simply can’t be done using a real USB 3.0 host controller.”
The SDA 813Zi with QualiPHY USB 3.0 automated compliance test software is the perfect instrument for physical-level compliance testing and debugging of USB 3.0 transmitters. Developers can debug their signal after Continuous Time Linear Equalization (CTLE) and channel emulation by creating the eye diagram and measuring jitter after the reference channel and equalization as required by the SuperSpeed USB Compliance Specification.
Finally, the TDR analysis feature of the LeCroy WaveExpert™ 100H sampling oscilloscope measures Tx and Rx common mode, and differential mode impedance as required by the USB 3.0 specification. The measurements are integrated into the user interface along with a measurement wizard that guides the user through the set-up and calibration process.
“SuperSpeed USB presents developers with certain new challenges posed by the significantly greater speed and more complex features,” said Graef. “LeCroy is the first to provide a single-source comprehensive SuperSpeed USB test suite solution that addresses the increasingly sophisticated measurement and analysis capabilities that are required.”
LeCroy has ensured that the components of its USB 3.0 Test Suite are as easy to order as they are to use. Test bundles include all necessary software, fixtures and cables, and are available for each of the component tests – transmitter, receiver, transmitter and receiver, TDR and protocol – as well as the all-inclusive USB 3.0 Test Suite. USB developers will find a significant cost savings when purchasing the bundles rather than the individual test instruments.