Test & Measurement

Kit adds test capabilities to legacy semiconductor test system

30th June 2017
Alice Matthews

Provider of globally-deployed innovative test solutions for military, aerospace, and manufacturing organisations, Marvin Test Solutions, has announced the release of a new semiconductor test subsystem aimed at extending the life of legacy semiconductor testers. The MTEK Subsystem (Marvin Test Expansion Kit) adds test capabilities to legacy semiconductor test systems that lack the ability to meet the test requirements of current devices.

Based on MTS’ extensive portfolio of PXI/PXIe chassis and instrumentation as well as selections from other suppliers, MTEK allows customers to configure a subsystem with exactly the resources needed to deliver the capabilities lacking in their current legacy ATE. MTEK is a compact, easy-to-integrate, open architecture plug-and-play solution that cost-effectively adds RF, hi-performance digital, and/or hi-performance analogue capabilities.

MTEK is compatible with multiple legacy semiconductor test platforms, including Teradyne, LTX/Credence, Eagle, ASL100, Sentry, and Verigy. Easily expandable in the field, MTEK is designed to support both engineering and production environments.

“Our customers were looking for a solution that would allow them to extend the life of their existing test systems without the associated capital investment of complete replacement,” said Stephen T. Sargeant, CEO of Marvin Test Solutions. “MTEK provides an upgrade path with the additional test capabilities they need as their requirements change.”

MTEK and other MTS semiconductor test solutions will be showcased at SEMICON West 11th to 13th July at the Moscone Center in San Francisco, CA. Attending the event will be CEO Stephen T. Sargeant, and Director of North American Sales Jim Fraine.

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