Test & Measurement

5G, LTE-A test solutions feature at Mobile World Congress

17th February 2015
Mick Elliott

Keysight Technologies will fly into Mobile World Congress in Barcelona (March 2-6) with its newest wireless design and test solutions that address present and future wireless design and test challenges. The company will showcase innovations in LTE-A, including 3GPP, Releases 11, 12 and 13 and also will demonstrate leading edge 5G wireless test and simulation solutions.

The demonstrations will focus on the high-performance design and test solutions required to address increased peak data rates with multiple technologies. This includes Carrier Aggregation, enhanced use of multi-antenna techniques and enhanced uplink for next-generation wireless devices in R&D and manufacturing.

On partade will be the E75151A UXM wireless test set. It’s powerful and extensible architecture is ready to handle the challenges of the latest LTE-Advanced evolutions, such as 4CC, 256 QAM, and UE categories 11 to 14. Keysight will demonstrate full, end-to-end IP data throughput of 450 Mbps with integrated, independent fading and noise for each component carrier, along with advanced small-cell technology, such as FeICIC, for verifying HetNet and cell-edge performance enhancements.

Small-footprint conformance test solutions including the T4000S-series wireless systems offer RF, RRM and PCT conformance and design verification test, including LTE-A test cases and CA band combinations. The compact design, based on a common hardware set, minimises space requirements – scaling from bench-top to a full rack system. Additional, customisable test plans can be used to exhaustively verify UE design beyond conformance. Test automation combined with remote user interface enables extended test without tying up valuable engineering resource,

The first one-box tester dedicated to femtocell manufacturing will be on show. The E6650A EXF wireless test set,  is validated with the latest WLAN and cellular chipsets, including LTE and LTE-A. The EXF delivers the speed, performance, and cost control with the scalability required to ramp up rapidly and lower the cost of test in manufacturing.

5G will figure heavily through the event and Keysight will come armed with comprehensive 5G electronic design, simulation and test tools. The 5G simulation and measurement solutions include: mmWave, broadband generation and analysis; physical layer designs; MIMO, RF, microwave, and millimeter-wave components and antennas; high-speed digital and power management.

Keysight is working closely with industry consortia, industry-leading companies and academia to enable the next-generation of wireless communications systems and will showcase some breakthrough 5G solutions.

These include Keysight’s 5G Baseband Exploration Library. This design software solution supports a collection of 5G candidate waveforms for orthogonal and non-orthogonal multi-carrier air-interface designs and includes advanced MIMO and beam-forming signal processing. The library also provides transmitter and reference receiver modeling examples that can be easily re-designed to achieve optimal performance for comparison of each of the candidate standards proposals.

One key strength of the 5G Baseband Exploration Library, its ability to integrate with existing test hardware for simultaneous simulation and emulation, will be demonstrated with Keysight’s flexible 5G test platform.

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