Test & Measurement

Design, test characterisation solutions prepared for Paris

18th August 2015
Mick Elliott

Keysight Technologies is heading to European Microwave Week in Paris ready to demonstrate a wide range of design, test and characterisation solutions.  Keysight has been a twelve-year platinum sponsor of the event, and it will have technical experts on hand to discuss and demonstrate the latest high-performance hardware and software solutions.

These are the tools that today’s engineers need to gain insight into designing, testing and characterising components for radar systems, antennas and next-generation wireless devices.        

RF and Microwave Circuit Design Solutions will be to the fore. Visitors will be able to learn about Keysight’s EEsof EDA Advanced Design System. Keysight technical experts will be on hand to discuss itscapabilities for silicon RFIC and RF microwave design, including ADS/Virtuoso interoperability flow, with EM capabilities from Keysight EEsof EDA EMPro for IC and module design and RFIC packaging.

Visitors to the show will also be able to learn how to generate and analyse a variety of wideband millimetre-wave signals, including 5G, 802.11ad, and backhaul including digital modulation and analysis.

Terahertz solutions for device and material test for measuring the relative permittivity and loss tangent of dielectric materials at millimeter wave and terahertz frequency will be demonstrated. This is especially useful with stealth materials, dielectric substrates, microwave food products and biofuels.

Visitors will see capacitance measurements at the nanoscale using Keysight’s scanning microwave microscopy (SMM) mode that combines the comprehensive electrical measurement capabilities of a vector network analyser (VNA) with the outstanding spatial resolution of an atomic force microscope (AFM).

Another highlight will show how to perform complete linear and non-linear characterisation using the Keysight PNA-X (pictured) microwave test engine for measuring modern, active devices, such as amplifiers, mixers and frequency converters.

Modular PXI solutions for production and research labs will be shown, including multi-function and multi-port scalable test beds using Keysight’s PXI-VNA, a full, two-port VNA that uses only one slot. Keysight’s modular solutions leverage existing measurement science from benchtop instruments to perform fast, accurate measurements while reducing the cost-of-test.

Radar and Electronic Warfare applications will be covered by simulated multi-emitter electronic warfare threat scenarios enabling users to gain deeper confidence in electronic warfare (EW) system performance using Keysight’s UXG with Signal Studio for multi-emitter scenario generation software. How to analyse and measure pulse characteristics using the 89600 VSA software will be demonstrated.

Next generation radar and electronic warfare (EW) test systems that must meet diverse, deceptive and agile threat environments will be explained and visitors will see how Keysight’s test solutions offer modular building blocks that address the requirements for multi-channel, reconfigurable multi-function aspects of next generation wideband radar.

Wideband signal generation and analysis of multi-tone and modulated signals, up to 2GHz, using Keysight’s Z9070B signal analysis solution will be covered along with RF and microwave field measurements using the FieldFox analyser for radar, satellite and cable measurement applications.

Keysight experts will be in place to host RF and microwave circuit design; millimeter wave and terahertz test; material and component characterization; and radar and electronic warfare applications workshops througout the week.

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