Test & Measurement

Integrating rapid RSE and passive measurement

10th October 2019
Alex Lynn
0

Global leader in EMC and antenna testing and measurement, Microwave Vision Group (MVG) has announced the integration of Radiated Spurious Emissions (RSE) and passive antenna measurement capabilities into its popular, compact and highly accurate lab-based test system, MiniLAB.

Delivering a faster design and production process for applications in which time-to-market is critical, this much anticipated range extension allows engineers to perform quality, repeatable OTA testing, as well as passive measurements and a class-leading method for measuring RSE on LTE devices, all on one compact, portable testing system.

Dramatically reducing measurement time, MiniLAB employs multi-probe technology to measure RSE, compared to the more traditional, time-consuming method of using vertically scanned mechanical movement to monitor the device as it rotates in azimuth. 

Generating precise data within 20 seconds of measurement completion, the probe-array arch utilises electronic scans to measure the wireless device, making it easier and faster for users to measure RSE in the presence of LTE frequency bands up to 6GHz. 

Equipped with an anechoic shielded chamber with >100 dB RF attenuation, MiniLAB offers a high dynamic range to measure peak levels of both the transmitted wireless signals and the surrounding emissions without distortions. 

With its electronically scanned probe-array arch enclosed in a high-isolated chamber, MiniLAB quickly measures radiation patterns of devices up to 30cm in diameter, making it the ideal solution to optimise the antenna performance of a wide range of devices. 

Built to satisfy the strict testing requirements for measuring RSE on wireless devices, as governed by standardisation authorities such as the International Telecommunication Union (ITU), the European Radio and Telecommunications Terminal Equipment (R&TTE) Directive, and the Federal Communications Commission (FCC).

Featured products

Upcoming Events

No events found.
Newsletter
Latest global electronics news
© Copyright 2024 Electronic Specifier