Test & Measurement

High frequency resolution option for beyond 5G

1st October 2021
Mick Elliott

Semiconductor test equipment supplier Advantest has announced a high frequency resolution option for its TAS7400TS terahertz optical sampling analysis system.

Featuring excellent cost performance and ease of operation, the new option provides a groundbreaking measurement method for high-frequency characteristic evaluation of radio wave absorbers and base materials, which are indispensable for Beyond 5G / 6G next-generation communications technology and for the millimeter-wave radar technology used in ADAS (advanced driver assistance systems).

Vector network analysers (VNAs) have been widely used to evaluate the transmission characteristics (transmittance, reflectance) and complex permittivity of various materials in the millimeter-wave and high-frequency regions.

But in recent years, it has become important to evaluate these characteristics over wider bandwidths, raising issues with VNAs on account of the time and effort required to set and calibrate each frequency band.Advantest's terahertz optical sampling system addresses these issues by enabling batch measurement over a wide band, utilising pulsed electromagnetic waves.

Measurements are now possible with a compact optical sampling system (measurement environment), saving on cost and space. It is also possible to analyse surface frequency characteristics with the mapping measurement option. Furthermore, the frequency resolution and scan speed of the new option are 5x that of the previous product, making this an optimal solution for evaluating the high frequency characteristics of new materials.

The solution will be exhibited at JASIS, from November 8th to 10th, and at MWE 2021 from November 24th to 26th.

Featured products

Product Spotlight

Upcoming Events

View all events
Newsletter
Latest global electronics news
© Copyright 2021 Electronic Specifier