Test & Measurement

GOEPEL electronic - JTAG/Boundary Scan Platforms integrated into Polar Instruments Flying Prober GRS500

24th September 2009
ES Admin
0
GOEPEL electronic, leading vendor of JTAG/Boundary Scan solutions compliant with IEEE Std.1149.x, and Polar Instruments recently developed a next generation JTAG/Boundary Scan option for the Flying Prober series with an OEM cooperation. The solution is based on a full integration of the hardware architectures ScanBooster and SCANFLEX in combination with the JTAG/Boundary Scan system software CASCON GALAXY and also involves the probe of the Polar GRS500.
“There are increasing demands in complementing the flexible abilities of the Polar Flying Probe test system with the advantages of a JTAG/Boundary Scan test. Because of the current development cooperation we’re able to offer another powerful solution,” says Alexander Beck, expert for integration solutions at GOEPEL electronic.



Herman Reischer, Product Manager, ICT Sales and Technical Services, Polar Instruments, adds: “Now it is possible to provide this innovative solution not only for new generation Polar Instruments Flying Probe systems but as an additional opportunity for previous products. Therefore, existing Polar users are able to upgrade their test solutions and to take advantage of the SCANFLEX® products and Boundary Scan.”



There are two different levels of integration options. On the first level, SYSTEM CASCON™ is integrated into the system interface of Polar Instruments via Teststand® and LabVIEW® in the Active Test Area. At this level, a ScanBooster/USB controller executes the Boundary Scan tests of SYSTEM CASCON™.



The second level of integration is achieved with the SCANFLEX® hardware based on a SFX 5704 I/O module for signal controlling and evaluation of the probe. This enables an interactive test between Flying Prober and Boundary Scan. The technology named Virtual ScanPin enables the diagnostic of all faults such as open solder joints, shorts etc between Boundary Scan IC and test point. Just like in the first solution, the automatically generated tests are integrated in the Polar interface.



Product Spotlight

Upcoming Events

View all events
Newsletter
Latest global electronics news
© Copyright 2024 Electronic Specifier