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GOEPEL electronic continues Webinar Series on Automated Optical Inspection

12th January 2011

ES Admin

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GOEPEL electronic will run four additional webinars about Automated Optical Inspection (AOI) issues on throughout February 2011. The events will start at 11 am EST and will last about one hour each. The first webinar on February 3rd will provide an overview of test/inspection capabilities of Automated Optical Inspection (AOI) systems in general, with a discussion of technology specific advantages and limitations of various AOI methodologies.

The second webinar on February 10th focuses on the comparison of various test technologies, including manual inspection, In-Circuit Test (ICT), Functional Test, JTAG/Boundary Scan, and AOI. Defect types will be discussed, as well as if and how certain defects can be detected with these test methods.

The February 17th webinar will outline ways to integrate AOI systems in electronics manufacturing/production environment. Topics to be discussed are in-line, off-line, and hybrid integrations including examples for each of those options.

The final webinar in this series takes place on February 24th and will feature a discussion of various illumination strategies used in AOI systems, outlining how smart illumination schemes can provide enhanced defect detection.