TS-900 offers cost effective and configurable test solution with comparable features to proprietary ATE systems.
By leveraging the performance and cost advantages of the PXI architecture, Geotest has been able to develop a test system for semiconductor OEMs, fabless semiconductor vendors and packaging / test vendors needing a low cost, modular and configurable test system‖ said Loofie Gutterman, president of Geotest. ―The TS-900 is part of our overall business strategy to deliver cost effective products and solutions for ATE applications. By combining high-performance PXI products such as the GX5295 with additional PXI resources and an innovative receiver interface, Geotest continues to set the pace for delivering products offering outstanding value and performance.‖
The basic TS-900 test system includes 64, 100 MHz digital I/O channels; 64 static digital I/O channels; a programmable user power supply; a system self-test and fixture. The software supplied with the TS-900 includes Geotest’s DIOEasy for digital waveform editing / display and ATEasy which provides an integrated and complete test executive and test development environment, allowing users to quickly develop and easily maintain test applications. In addition, software tools are available for converting digital vectors from ASCII, WGL or STIL formats. The TS-900 is available in both bench top or cart configurations – providing additional flexibility for laboratory or production floor applications.