“Testing Modern Power Semiconductor Devices Requires a Modern Curve Tracer” is recommended for engineers, physicists, and scientists involved in the designing, testing or manufacturing of power semiconductor devices and examines a variety of topics:
• The role of traditional curve tracers in testing power semiconductor devices
• The market drivers for modern power semiconductor devices
• How source measure unit (SMU) instruments can be configured to create a modern parametric curve tracer
• How to perform high voltage C-V measurements with a modern parametric curve tracer
To register for this event, visit www.keithley.com/ws/1388.
Free Seminar Tackles Curve Tracing Challenges in Power Semiconductors
Keithley Instruments is to offer a free, web-based seminar titled “Testing Modern Power Semiconductor Devices Requires a Modern Curve Tracer.” This event, which is available for on-demand viewing, will discuss the curve tracing challenges posed by today’s power semiconductor devices and will teach viewers how to perform both I-V and high voltage C-V measurements with a modern parametric curve tracer.