EuMW 2019: Test times cut for 5G mmWave OTA validation
A hardware-accelerated 5G mmWave OTA Validation Test reference architecture for thorough characterisation and validation of 5G mmWave beamforming AiP devices was unveiled by NI at European Microwave Week in Paris (October 1-3).
NI’s mmWave OTA Validation Test reference architecture achieves fast speeds for OTA spatial sweeps in the 5G mmWave bands from 24 to 44GHz, significantly reducing OTA RF validation test times for AiP devices, compared to traditional point-by-point, software-controlled test systems.
This new reference architecture gives characterisation and validation engineers working on the latest 5G AiP devices the advantage of addressing their devices’ beamforming performance with wider and more complex 5G NR signals while shortening development schedules.
This OTA test approach helps engineers use denser spatial grids and obtain finer 3D spatial resolution while keeping test times low.
Using NI’s mmWave OTA Validation Test Software, validation engineers can quickly configure these extensive spatial sweeps to characterise their device’s antenna patterns as they produce, visualise, store or distribute detailed parametric results.
“In the rapidly evolving 5G mmWave semiconductor industry, test systems need to be ready for a new class of 5G beamforming devices,” said Alastair Upton, chief strategy officer at Anokiwave. “Engineers will need fast, accurate and fairly-priced tools to measure and ensure device beamforming performance so that the next generation of mmWave semiconductors can reach its global potential.”
NI’s mmWave OTA Validation Test reference architecture includes an mmWave VST for wideband RF signal generation and measurement, PXI instruments for repeatable and precise motion control, and isolated RF chamber for true far-field radiated testing in a quiet environment.