Test & Measurement

Increase PCB Lifetime by up to 100 Percent — Multitest’s DuraPad significantly reduces pad wear

16th February 2012
ES Admin
0
Multitest announces that its proprietary DuraPad surface has been proven to significantly reduce the effects of pad wear caused by pogo pin style contactors. Specifically, fine-pitch boards of 0.5 mm or below and boards for resistance sensitive testing are particularly vulnerable to pad wear. DuraPad brings substantial cost of test savings to high-volume production sites of array packages and WLSCPs.
Multitest has performed extensive pad wear analyses to understand the actual issues with established surface coatings and to be able to provide the DuraPad™ solution. The company’s unique product portfolio of handlers, contactors and boards enabled the engineers to apply Multitest’s comprehensive knowledge of the mechanical interactions. The results were presented at BiTS 2010 and 2011.

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