Test & Measurement

Contactor offers M2M evaluation bench & reliability testing

9th February 2015
Barney Scott
0

Yamaichi has released test contactors for M2M modules which manage global positioning and data transmission in industrial, consumer and automotive products. M2M modules allow the interconnection of electronics apparatus and enable automated communication to provide wireless control and real-time monitoring.

For testing such modules, Yamaichi has added a test contactor solution to its YED274 series. The contactor is individually modified for the different M2M module outlines and can be used for evaluation bench tests and reliability tests, from -50 to +150°C.

Through Yamaichi Electronics' experience in developing test & burn-in sockets, the opening and closing mechanism is designed for easy handling. The socket is designed with compression mount technology, therefore no soldering is needed. Selected materials like aircraft aluminum, PEEK and ceramic PEEK make the socket robust.

Most of the M2M modules have gold pads as contacting surface. The best contact technology for such surface areas are fine pitch probe pins. The pins, known from semiconductor testing, have a long life time of more than 500k mechanical cycles. The life time cycle may vary according to the usage of the pins in harsh environment, at high temperature or on contact surfaces other than gold.

For contacting the module pads, a conical type plunger tip is commonly used. By using such a tip it can be assured that only a very small witness mark is formed on the module contact pad. The fine-pitch pins are available for pitches starting from 0.3mm. There are also Kelvin type pins available.

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