All new LTE data fields up to Release 9 are included in the 256K/J Test (U)SIM. The card has implemented three applications: a Test SIM, a Test USIM and a Test ISIM. The Test (U)SIM also supports the three voltage classes 1.8V, 3V and 5V. The LTE Test (U)SIM supports the standardised “Resize” command to extend the size of a data field and the “Create” command with which it is possible to create new data fields. The card’s flexibility and feature range enable the user to comprehensively examine the functionality of an LTE mobile device without having access to a live LTE network.
“The new LTE test card helps advancing LTE development and assures the correct interworking of mobile phones and (U)SIM cards using the new LTE standard,” states Daniela Wittkamp, Test (U)SIM Product Manager at COMPRION.