Test & Measurement

CellMetric launches 4G LTE eNodeB Test Signal Generator

25th January 2010
ES Admin
0
Cambridge based digital cellular and broadcast company CellMetric announces the launch of a Long Term Evolution (LTE) eNodeB 4G base station test signal generator. CellMetric’s Modus 6 LTE test solution is compliant with Release 8 of the Third Generation Partnership Project standard (3GPP) and supports both Time Domain Duplex (TDD) and Frequency Domain Duplex (FDD) modes. This follows the 11th December 2008 functional freeze of LTE as part of 3GPP Release 8.
CellMetric’s Modus 6 LTE base station test signal generator consists of one or more Modus 6 air interface units providing the RF transmission and LTE Composer, a PC based application which generates the protocol and RF transmission scenarios to emulate eNodeB base station transmissions. The LTE Composer application has been developed in close collaboration with Qasara Ltd, ( www.qasara.com ) a specialist LTE technology development company. The combination of the two tools provide a highly flexible, comprehensive and cost effective solution for LTE User Equipment (UE) and handset baseband and RF development and testing.

CellMetric’s LTE tester provides a highly sophisticated RF and protocol sequence generation environment in which LTE RF and baseband chipset companies and cellular handset developers can quickly test their solutions against a repeatable and deterministic test stimulus over the air. This capability includes RF channel emulation allowing the signal generator to generate a RF signal as seen either at the output of the base station transmit antennas or at the input of the user equipment’s receive antennas. Both transmit and receive Multiple-input Multiple-output (MIMO) antenna configurations can be emulated by using two synchronised Modus 6 air interfaces. Modus 6 supports LTE RF channel bandwidths of 1.4, 3, 5 and 10 MHz in the band 824 MHz to 2155 MHz that is FDD bands I, II, III, IV, V, VI, VIII, IX and X and TDD bands a, b and c.

Product Spotlight

Upcoming Events

View all events
Newsletter
Latest global electronics news
© Copyright 2024 Electronic Specifier