Case study explains IJTAG embedded instruments standard

“Now that the IEEE P1687 IJTAG embedded instrumentation standard has passed ballot, it’s time for the various semiconductor test and board test tool vendors who make up the IJTAG ecosystem to start showing chip, board, and system design engineers how to deploy this exciting new technology,” said John Potter, senior principal technologist for ASSET and one of three authors of the case study. “Our case study demonstrates how Synopsys’ DFTMAX and TetraMAX, and ASSET’s ScanWorks can support the in-situ defect diagnosis in a product life cycle, beginning with chip test and verification, through board-level manufacturing test and diagnostics, and even field service applications.”

“We have a long relationship with ASSET that started with ensuring interoperability of our boundary scan products for our mutual customers,” said Robert Ruiz, senior marketing manager for test products at Synopsys. “Together we pioneered the first successful production IJTAG flow for test instruments covering IC design, system integration and test. For maximum productivity, the flow is compatible with our leading hierarchical design-for-test solution.”