With low-noise amplifier tests there are typically multiple test stations, such as small signal gain/match, distortions and noise figure; the PNA-X integrates these test stations into one. By integrating measurements from multiple test stations into one, the PNA-X reduces the number of test stations by as much as 75 percent and reduces costs by 30 percent.
The new model also now brings the NVNA solution to engineers working in the RF and microwave frequency ranges. Using NVNA, X-parameters are measured and then used to create X-parameter models that can be imported into Agilent’s Advanced Design System (ADS) to simulate actual linear and nonlinear component behaviour.
Key features of the PNA-X Series network analysers include
- single-connection, multiple measurements. The configurable 2- or 4-port network analysers offer a unique single-connection solution for CW and pulsed S-parameter, compression, intermodulation distortion (IMD) and noise figure measurements
- Two built-in high-performance signal sources, making the PNA-X the industry’s only 2-port network analyser with an internal second source. Sources offer high output power (+16 dBm), low harmonics (-60 dBc) and a wide power sweep range (40 dB).
- Internal signal-routing switches. Switches provide increased flexibility for adding signal conditioning hardware or additional test equipment for single connection measurements
- Internal pulse modulators and generators for fast, simplified pulse measurement. This advanced capability enables pulse measurements up to 30 times faster compared with other analysers that require external generators and modulators