27GHz PXI vector signal analyser unveiled

The analyser design offers engineers the ability to validate the true performance of leading-edge and legacy devices with frequency coverage from 9 kHz to 27 GHz and 160 MHz analysis bandwidth. In addition to performance including ±0.15 dB absolute amplitude accuracy, -160 dBm displayed average noise level (DANL), with preamplifier, and +30 dBm third-order intermodulation (TOI)—the M9393A delivers frequency switching in less than 150 microseconds, dramatically reducing test time to increase throughput.

The analyser leverages Agilent’s X-Series measurement applications and 89600 VSA software, which offers deep programmatic compatibility with Agilent’s benchtop signal analysers to maximise test code reuse. It provides consistent, accurate results across instrument form-factor and product lifecycle. The 89600 VSA software’s new stepped spectrum capability allows the M9393A to measure across 27 GHz in less than 1 second, with 10 kHz resolution bandwidth, for fast measurements of harmonics and spurs. The X-Series measurement applications for modular instruments can be used with the analyser to simplify device conformance testing for LTE, WLAN and more.

The analyser is designed for extensibility. License-key upgradeable options for frequency, analysis bandwidth, preamplifiers and memory allow engineers to easily adapt to changing test needs with quick system updates. The modular architecture means that as hardware advances, a single module’s upgrade or replacement maximizes reuse of existing equipment and dramatically reduces the cost of test.

Using Agilent’s M9037A PI embedded controller, the analyser measurement capability speed is increased. A high-performance PC computer designed for complex or multi-chassis systems and secure environments, the controller features a 2.4 GHz quad-core processor with up to 12 GB/s data bandwidth. The high-speed CPU is based on the Intel i7 4700EQ and adds the advantage of fast computation speeds such as needed for EVM and power measurements, thus decreasing test time and increase throughput.