Test & Measurement

Agilent Technologies to Launch Modular Automotive Functional Test Solution, Demonstrate In-circuit Test Applications

13th April 2011
ES Admin

Agilent Technologies Inc. will unveil its new modular PXI-based TS-8900 automotive functional test system at the IPC APEX EXPO in Las Vegas next week. The test system provides a standard platform - with 20 percent higher throughput - for manufacturers of medium- to high-pin-count electronic control units.

The system includes a high-channel-count voltage acquisition module; a large voltage-current range source; a high-voltage and channel digital-to-analog converter, enabling parallel test methodologies; and 200 automotive applications-tuned libraries for faster deployment.

Other key products Agilent will show at the expo include:

The Medalist i3070 Series 5 in-circuit test (ICT) system, with breakthrough ICT inspection of LEDs and high-power testing capabilities.
The Agilent Test Coverage Consultant, an intelligent predictive tool that analyzes circuits with Agilent's ICT technologies to help optimize the user's test strategy.
New applications of Agilent's low-cost Medalist i1000D ICT, with an integrated board handler for smart phone, LED, automotive fuse box and limited access tests.

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