Also on display are the T2000 IPS tester for integrated power devices, and performance boards that support a host of test requirements for state-of-the-art ICs such as analogue, high-speed and high-density devices.
For attendees interested in advanced metrology and nano-patterning applications, the stand will include exhibits on Advantest’s line of E3310, E3640and E5610 SEMs for inspecting next-generation wafers, photomasks and blanks as well as the F7000 system enabling E-beam lithography at advanced technology nodes.
Advantest’s exhibit also will include live demonstrations of the EVA100 tester for digital and analogue testing of small-pin-count semiconductors and Advantest’s CloudTesting Service, providing access to the latest high-quality test methods utilizing advanced IP, characterisation tools, analysis systems and more for design and DFT engineers.
In addition, Advantest will be presenting a paper titled Testing IoT Devices: The Next ATE Challenge on October 7.